Vayshenker, I. P.: search on Z-Library

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1

“As soon as people hear that word…”: associative stigma among clinicians working with people with serious mental illness

Vayshenker, Beth A., DeLuca, Joseph, Bustle, Timothy, Yanos, Philip

Journal:

Journal of Public Mental Health

Year:

2018

Language:

english

File:

PDF, 175 KB

english, 2018

2

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Impact of charge trapping on the voltage acceleration of TDDB in metal gate/high-k n-channel MOSFETs

Kerber, A., Vayshenker, A., Lipp, D., Nigam, T., Cartier, E.

Year:

2010

Language:

english

File:

PDF, 380 KB

english, 2010

3

Crisis Intervention Training and Implicit Stigma Toward Mental Illness: Reducing Bias Among Criminal Justice Personnel

Mulay, Abby L., Vayshenker, Beth, West, Michelle L., Kelly, Elspeth

Journal:

International Journal of Forensic Mental Health

Year:

2016

Language:

english

File:

PDF, 573 KB

english, 2016

4

Participation in peer support services and outcomes related to recovery.

Vayshenker, Beth, Mulay, Abby L., Gonzales, Lauren, West, Michelle L., Brown, Isaac, Yanos, Philip T.

Journal:

Psychiatric Rehabilitation Journal

Year:

2016

Language:

english

File:

PDF, 99 KB

english, 2016

5

[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - Gate oxide breakdown under Current Limited Constant Voltage Stress

Linder, B.P., Stathis, J.H., Wachnik, R.A., Wu, E., Cohen, S.A., Ray, A., Vayshenker, A.

Year:

2000

Language:

english

File:

PDF, 234 KB

english, 2000

6

Transfer function approach to the experimental determination of mode transfer matrices

Yang, S., Hjelme, D. R., Januar, I. P., Vayshenker, I. P., Mickelson, Alan R.

Journal:

Year:

1990

Language:

english

File:

PDF, 1.02 MB

english, 1990

7

New global insight in ultrathin oxide reliability using accurate experimental methodology and comprehensive database

Wu, E., Nowak, E., Vayshenker, A., McKenna, J., Harmon, D., Vollertsen, R.-P.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2001

Language:

english

File:

PDF, 474 KB

english, 2001

8

Verification of calibration methods for determining photon-counting detection efficiency using superconducting nano-wire single photon detectors

Mueller, I., Horansky, R. D., Lehman, J. H., Nam, S.W., Vayshenker, I., Werner, L., Wuebbeler, G., White, M.

Journal:

Year:

2017

Language:

english

File:

PDF, 7.05 MB

english, 2017

9

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - 65nm cmos technology for low power applications

Steegen, A., Mo, R., Mann, R., Sun, M.-C., Eller, M., Leake, G., Vietzke, D., Tilke, A., Guarin, F., Fischer, A., Pompl, T., Massey, G., Vayshenker, A., Tan, W.L., Ebert, A., Lin, W., Gao, W., Lian, J

Year:

2005

Language:

english

File:

PDF, 2.23 MB

english, 2005

10

Experimental evidence of TBD power-law for voltage dependence of oxide breakdown in ultrathin gate oxides

Wu, E.Y., Vayshenker, A., Nowak, E., Sune, J., Vollertsen, R.-P., Lai, W., Harmon, D.

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 509 KB

english, 2002

11

Critical reliability challenges in scaling SiO2-based dielectric to its limit

E.Y. Wu, J. Suñé, W. Lai, A. Vayshenker, E. Nowak, D. Harmon

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 254 KB

english, 2003

12

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Voltage-dependent voltage-acceleration of oxide breakdown for ultra-thin oxides

Wu, E.Y., Aitken, J., Nowak, E., Vayshenker, A., Varekamp, P., Hueckel, G., McKenna, J., Harmon, D., Han, L.-K., Montrose, C., Dufresne, R.

Year:

2000

Language:

english

File:

PDF, 398 KB

english, 2000

13

Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent

Miller, Aaron J., Lita, Adriana E., Calkins, Brice, Vayshenker, Igor, Gruber, Steven M., Nam, Sae Woo

Journal:

Year:

2011

Language:

english

File:

PDF, 1.30 MB

english, 2011

14

Characteristics and service use of participants in a large consumer-operated service agency.

Chan, Ginny, Vayshenker, Beth, Gonzales, Lauren, Mulay, Abby L., Brown, Isaac, Yanos, Philip T.

Journal:

Psychiatric Rehabilitation Journal

Year:

2014

Language:

english

File:

PDF, 60 KB

english, 2014

15

CMOS scaling beyond the 100-nm node with silicon-dioxide-based gate dielectrics

Wu, E. Y., Nowak, E. J., Vayshenker, A., Lai, W. L., Harmon, D. L.

Journal:

IBM Journal of Research and Development

Year:

2002

Language:

english

File:

PDF, 263 KB

english, 2002

16

[IEEE Conference on Precision Electromagnetic Measurements Digest - Boulder, CO, USA (27 June-1 July 1994)] Proceedings of Conference on Precision Electromagnetic Measurements Digest - Optical detector nonlinearity: a comparison of five methods

Shao Yang,, Vayshenker, I., Xiaoyu Li,, Scott, T.R.

Year:

1994

Language:

english

File:

PDF, 133 KB

english, 1994

17

SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Photodetectors and Power Meters II - Automated measurement of nonlinearity of optical fiber power meters

Vayshenker, Igor, Yang, Shao, Li, Xiaoyu, Scott, Thomas R., Muray, Kathleen, Kaufmann, Kenneth J.

Year:

1995

Language:

english

File:

PDF, 451 KB

english, 1995

18

Optical-Fiber Power Meter Comparison between NIST and KRISS

Vayshenker, I., Kim, S.K., Hong, K., Lee, D.-H., Livigni, D.J., Li, X., Lehman, J.H.

Journal:

Journal of Research of the National Institute of Standards and Technology

Year:

2012

Language:

english

File:

PDF, 81 KB

english, 2012

19

Comparison of reference standards for measurements of optical-fibre power

S. V. Tikhomirov, A. I. Glazov, M. L. Kozatchenco, V. E. Kravtsov, A. B. Svetlichny, I. Vayshenker, T. R. Scott, D. L. Franzen

Year:

2000

Language:

english

File:

PDF, 48 KB

english, 2000

20

The influence of mental illness and criminality self-stigmas and racial self-concept on outcomes in a forensic psychiatric sample.

West, Michelle L., Vayshenker, Beth, Rotter, Merrill, Yanos, Philip T.

Journal:

Psychiatric Rehabilitation Journal

Year:

2015

Language:

english

File:

PDF, 105 KB

english, 2015

21

Interplay of voltage and temperature acceleration of oxide breakdown for ultra-thin gate oxides

E Wu, J Suñé, W Lai, E Nowak, J McKenna, A Vayshenker, D Harmon

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 339 KB

english, 2002

22

[IEEE Technical Digest - Symposium on Optical Fiber Measurements - Boulder, CO, USA (2004.9.28-2004.9.30)] Technical Digest: Symposium on Optical Fiber Measurements, 2004. - High-power nonlinearity of optical fiber power meters

Vayshenker, I., Swafford, R., Shao Yang,

Year:

2004

Language:

english

File:

PDF, 159 KB

english, 2004

23

Cryogenic primary standard for optical fibre power measurement

White, M G, Ruiz, Z E, Yung, C S, Vayshenker, I, Tomlin, N A, Stephens, M S, Lehman, J H

Journal:

Year:

2018

Language:

english

File:

PDF, 1.27 MB

english, 2018

24

Voltage dependence of hard breakdown growth and the reliability implication in thin dielectrics

Linder, B.P., Lombardo, S., Stathis, J.H., Vayshenker, A., Frank, D.J.

Journal:

IEEE Electron Device Letters

Year:

2002

Language:

english

File:

PDF, 261 KB

english, 2002

25

Planar electrical-substitution carbon nanotube cryogenic radiometer

N. A. Tomlin, M. White, I. Vayshenker, S. I. Woods, J. H. Lehman

Year:

2015

Language:

english

File:

PDF, 1.98 MB

english, 2015

26

Trilateral optical powermeter comparison between NIST, NMIJ/AIST, and METAS

Vayshenker, I., Lehman, J. H., Livigni, D. J., Li, X., Amemiya, K., Fukuda, D., Mukai, S., Kimura, S., Endo, M., Morel, J.

Journal:

Year:

2007

Language:

english

File:

PDF, 619 KB

english, 2007

27

[IEEE 2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference CLEO EUROPE/IQEC - Munich, Germany (2013.05.12-2013.05.16)] 2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference CLEO EUROPE/IQEC - Superconducting single photon detectors

Nam, S., Calkins, B., Gerritts, T., Harrington, S., Lita, A. E., Marsili, F., Verma, V. B., Vayshenker, I., Mirin, R. P., Shaw, M., Farr, W., Stern, J. A.

Year:

2013

Language:

english

File:

PDF, 444 KB

english, 2013

28

High-efficiency superconducting nanowire single-photon detectors fabricated from MoSi thin-films

Verma, V. B., Korzh, B., Bussières, F., Horansky, R. D., Dyer, S. D., Lita, A. E., Vayshenker, I., Marsili, F., Shaw, M. D., Zbinden, H., Mirin, R. P., Nam, S. W.

Journal:

Year:

2015

Language:

english

File:

PDF, 1.67 MB

english, 2015

29

Development and Validation of a Scale Assessing Mental Health Clinicians’ Experiences of Associative Stigma

Yanos, Philip T., Vayshenker, Beth, DeLuca, Joseph S., O’Connor, Lauren K.

Journal:

Psychiatric Services

Year:

2017

Language:

english

File:

PDF, 478 KB

english, 2017

30

[IEEE 2020 IEEE 29th North Atlantic Test Workshop (NATW) - Albany, NY, USA (2020.6.17-2020.6.24)] 2020 IEEE 29th North Atlantic Test Workshop (NATW) - Self-heating characterization and its applications in technology development

Paliwoda, P., Toledano-Luque, M., Nigam, T., Guarin, F., Nour, M., Cimino, S., Pantisano, L., Gupta, A., Gonzalez, O. H., Hauser, M., Liu, W., Vayshenker, A., Ioannou, D., Lee, D., Jiang, L., Yee, P.,

Year:

2020

File:

PDF, 1.20 MB

2020

31

[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - Breakdown measurements of ultra-thin SiO/sub 2/ at low voltage

Stathis, J.H., Vayshenker, A., Varekamp, P.R., Wu, E.Y., Montrose, C., McKenna, J., DiMaria, D.J., Han, L.-K., Cartier, E., Wachnik, R.A., Linder, B.P.

Year:

2000

Language:

english

File:

PDF, 231 KB

english, 2000

32

Cryogenic primary standard for optical fibre power measurement

White, M G, Ruiz, Z E, Yung, C S, Vayshenker, I, Tomlin, N A, Stephens, M S, Lehman, J H

Journal:

Year:

2018

File:

PDF, 1.27 MB

2018

33

[IEEE 2013 IEEE Photonics Conference (IPC) - Bellevue, WA, USA (2013.09.8-2013.09.12)] 2013 IEEE Photonics Conference - Superconducting nanowire avalanche photodetectors

Nam, S., Calkins, B., Gerritts, T., Harrington, S., Lita, A. E., Marsili, F., Verma, V. B., Vayshenker, I., Mirin, R. P., Shaw, M., Farr, W., Stern, J. A.

Year:

2013

Language:

english

File:

PDF, 1.07 MB

english, 2013

34

The effect of change of voltage acceleration on temperature activation of oxide breakdown for ultrathin oxides

Wu, E.Y., McKenna, J.M., Lai, W., Nowak, E., Vayshenker, A.

Journal:

IEEE Electron Device Letters

Year:

2001

Language:

english

File:

PDF, 70 KB

english, 2001

35

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - A comprehensive investigation of gate oxide breakdown of P+Poly/PFETs under inversion mode

Wu, E., Sune, J., Wing Lai,, Vayshenker, A., Harmon, D.

Year:

2005

Language:

english

File:

PDF, 411 KB

english, 2005

36

Community Protection versus Individual Healing: Two Traditions in Community Mental Health

Yanos, Philip T., Knight, Edward L., Vayshenker, Beth, Gonzales, Lauren, DeLuca, Joseph S.

Journal:

Behavioral Sciences & the Law

Year:

2017

Language:

english

File:

PDF, 118 KB

english, 2017

37

Calibration of free-space and fiber-coupled single-photon detectors

Gerrits, Thomas, Migdall, Alan, Bienfang, Joshua, Lehman, John, Nam, Sae Woo, Splett, Jolene, Vayshenker, Igor, Wang, Jack C M

Journal:

Year:

2019

Language:

english

File:

PDF, 1.68 MB

english, 2019

38

Insight among people with severe mental illness, co-occurring PTSD and elevated psychotic symptoms: Correlates and relationship to treatment participation

Yanos, Philip T., Vayshenker, Beth, Pleskach, Pavel, Mueser, Kim T.

Journal:

Comprehensive Psychiatry

Year:

2016

Language:

english

File:

PDF, 215 KB

english, 2016

39

[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Cryogenic Primary Standard for Optical Fiber Power Measurement

White, M.G., Ruiz, Z.E., Vayshenker, I., Tomlin, N.A., Yung, C.S., Stephens, M.S., Lehman, J.R.

Year:

2018

Language:

english

File:

PDF, 314 KB

english, 2018

40

[IEEE 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020) - Denver (Aurora), CO, USA (2020.8.24-2020.8.28)] 2020 Conference on Precision Electromagnetic Measurements (CPEM) - Fresnel Reflection of Optical Fibres at Cryogenic Temperature for Absolute Radiometric Measurements

White, M.G., Baumann, E., Vayshenker, I., Ruiz, Z.E., Stephens, M.S., Lehman, J.H.

Year:

2020

File:

PDF, 315 KB

2020

41

Detecting single infrared photons with 93% system efficiency

Marsili, F., Verma, V. B., Stern, J. A., Harrington, S., Lita, A. E., Gerrits, T., Vayshenker, I., Baek, B., Shaw, M. D., Mirin, R. P., Nam, S. W.

Journal:

Nature Photonics

Year:

2013

Language:

english

File:

PDF, 697 KB

english, 2013

42

Optical-Fiber Power Meter Comparison between NIST and LAMETRO

Vayshenker, I., Jimenez, J., Ugalde, M. P., Lehman, J. H.

Journal:

Journal of Research of the National Institute of Standards and Technology

Year:

2019

Language:

english

File:

PDF, 242 KB

english, 2019

43

Nonlinearity of high-power optical fiber power meters at 1480 nm

Vayshenker, Igor, Yang, Shao, Swafford, Ralph

Journal:

Year:

2006

Language:

english

File:

PDF, 108 KB

english, 2006

44

Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and the National Metrology Institute of Japan at 1480 nm

Vayshenker, I., Yang, S., Amemiya, K., Mukai, S., Zama, T.

Journal:

Year:

2010

Language:

english

File:

PDF, 380 KB

english, 2010

45

Transfer function analysis of measured transfer matrices

Yang, Shao, Vayshenker, I. P., Hjelme, Dag R., Mickelson, Alan R.

Journal:

Year:

1989

Language:

english

File:

PDF, 1.15 MB

english, 1989

46

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Growth and scaling of oxide conduction after breakdown

Linder, B.P., Stathis, J.H., Frank, D.J., Lombardo, S., Vayshenker, A.

Year:

2003

Language:

english

File:

PDF, 299 KB

english, 2003

47

Silicon wedge-trap detector for optical fibre power measurements

J. Lehman, J. Sauvageau, I. Vayshenker, C. Cromer, K. Foley

Year:

1998

Language:

english

File:

PDF, 148 KB

english, 1998

48

Interplay of voltage and temperature acceleration of oxide breakdown for ultra-thin oxides

E Wu, J Suñé, W Lai, E Nowak, J McKenna, A Vayshenker, D Harmon

Journal:

Microelectronic Engineering

Year:

2001

Language:

english

File:

PDF, 215 KB

english, 2001

49

Comparison of optical-power meters between the NIST and the PTB

I. Vayshenker, H. Haars, X. Li, J. H. Lehman, D. J. Livigni

Year:

2000

Language:

english

File:

PDF, 48 KB

english, 2000

50

Connector-induced offsets in optical fiber powermeters

Vayshenker, Igor, Li, Xiaoyu, Keenan, Darryl A.

Journal:

Year:

2006

Language:

english

File:

PDF, 310 KB

english, 2006

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